c-Chart (Defect Count) Calculator
Calculate c-chart control limits for defect count data. Monitor the number of defects per inspection unit using Poisson-based SPC limits.
Calculate Cp process capability index from specification limits and process standard deviation. Assess whether your process spread fits tolerances.
| Metric | Value |
|---|---|
| Cp Point Estimate | 1.3889 |
| Lower Bound (95%) | 1.0314 |
| Upper Bound (95%) | 1.7463 |
| Sample Size | 30 |
| Cp | Sigma | PPM Defective | Yield % | Match |
|---|---|---|---|---|
| 0.33 | 1 sigma | 697,700 | 30.23% | |
| 0.67 | 2 sigma | 45,500 | 95.45% | |
| 1.00 | 3 sigma | 2,700 | 99.73% | |
| 1.33 | 4 sigma | 63 | 99.993700% | Current |
| 1.67 | 5 sigma | 0.570 | 99.999943% | |
| 2.00 | 6 sigma | 0.002 | 100.000000% |
| Index | Formula | What It Measures |
|---|---|---|
| Cp | (USL - LSL) / 6s | Potential capability (ignores centering) |
| Cpk | min(CPU, CPL) | Actual capability (accounts for shift) |
| CPU | (USL - mean) / 3s | Upper capability |
| CPL | (mean - LSL) / 3s | Lower capability |
| K | |mean - midspec| / (tol/2) | Centering index (0 = perfect) |
The Cp index (process capability) measures how well a process's natural variation fits within the specification limits. It compares the width of the specification range (USL − LSL) to the width of the process spread (6σ). A Cp of 1.0 means the process spread exactly fills the tolerance; above 1.0 means there is room to spare; below 1.0 means the process cannot consistently produce within specifications.
Cp assumes the process is centered between the specification limits. It does not account for how far the process mean is from the center of the spec range — that is what Cpk captures. Therefore, Cp represents the best a process could do if it were perfectly centered, making it useful for evaluating inherent process capability separate from centering.
This calculator takes your upper and lower specification limits and process standard deviation to compute Cp, showing whether your process has sufficient precision for the given tolerance range.
Cp tells you whether your process variation is fundamentally narrow enough for the tolerance. If Cp is low, reducing variation is required. If Cp is adequate but Cpk is not, centering the process is the priority. This distinction guides your improvement strategy.
Cp = (USL − LSL) / (6σ)
where:
• USL = Upper Specification Limit
• LSL = Lower Specification Limit
• σ = Process standard deviation (within-subgroup)Result: Cp = 1.39
Specification range = 10.5 − 9.5 = 1.0. Process spread = 6 × 0.12 = 0.72. Cp = 1.0 / 0.72 = 1.39. This indicates the process spread is narrower than the tolerance, leaving margin for centering errors.
Cp is sometimes called the process potential because it shows what the process could achieve if perfectly centered. It answers: "Is my process precise enough?" If Cp is high but Cpk is low, the fix is simple — shift the process mean. If Cp itself is low, you must reduce variation through process improvements.
Automotive OEMs (AIAG standards) typically require Cp ≥ 1.33 for existing processes and Cp ≥ 1.67 for new or critical characteristics. Medical device and aerospace companies may require even higher values depending on risk classification.
To increase Cp, you must either widen the tolerance (often not possible) or reduce process variation. Variation reduction strategies include better fixturing, tighter material specs, environmental control, and operator training.
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Cp measures the ratio of tolerance width to process spread, ignoring centering. Cpk accounts for how far the process mean is from the nearest spec limit. Cpk ≤ Cp always, with equality only when the process is perfectly centered.
Cp ≥ 1.0 means the process fits within specs. Cp ≥ 1.33 is the standard minimum for many industries. Automotive and aerospace often require Cp ≥ 1.67. Six Sigma targets Cp ≥ 2.0.
No. Cp is always ≥ 0 because both the specification range and 6σ are positive values. A very small Cp (e.g., 0.3) means the process is far too variable for the tolerance.
No. Cp requires both USL and LSL. For one-sided specs, use Cpk (specifically Cpu or Cpl for the relevant side) or calculate the capability index for the single limit.
Use the within-subgroup (short-term) standard deviation, often estimated from R-bar/d2 or S-bar/c4 from control chart data. This represents the inherent process variation.
A minimum of 25–30 subgroups (or 100+ individual measurements) is recommended for a reliable capability study. Fewer data points increase uncertainty in the σ estimate.
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